BIWIN DDR5 U-DIMM 16GB DDR5 4800 MHz DESKTOP RAM (BLACK) CL40

SKU : TWR3121 Category : RAM

27184.00 M.R.P.: 19999

Offer: offline price 20136 ₹ for PC Build only
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DDR5 UDIMM Power-Efficient DDR5 UDIMM Delivering Up to 5600 MT/s for High-Performance PCs Data Rate Up to 5600 MT/s Low Power Consumption Dual 32-Bit Sub-Channels


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Description

BIWIN DDR5 U-DIMM 16GB DDR5 4800 MHz DESKTOP RAM (BLACK) CL40

BIWIN DDR5 UDIMM is a high-performance, low-power 288-pin memory module fully compliant with JEDEC DDR5 standards. Operating at 1.1 V, it supports fast data transfer rates up to 5600 MT/s for significantly improved performance. It is designed to operate within a temperature range of 0°C to +85°Cfor reliable performance across various systems. The module is built with premium components for more stability, more reliability, and broader compatibility. It features on-die ECC (Error Correction Code) for improved data integrity, an integrated PMIC (Power Management IC) for better power regulation, and thermal monitoring for operational stability. BIWIN DDR5 UDIMM is widely used in desktops, workstation PCs, all-in-one PCs, and high-performance gaming PCs.

  • Low Power Consumption and Thermal Optimization

    Operating at just 1.1 V, BIWIN DDR5 UDIMM minimizes power consumption while maintaining stability at high frequencies. The onboard Power Management IC (PMIC) enhances power signal integrity, while the onboard SPD hub includes a built-in temperature sensor for real-time thermal monitoring.

  • 03

    Dual-Channel Architecture for Improved Throughput

    Available in 4800 MT/s and 5600 MT/s data rates, BIWIN DDR5 UDIMM is designed with dual 32-bit sub-channels, double burst length, and supports for Same-Bank Refresh commands. These architectural enhancements significantly improve data throughput, boosting performance in multi-tasking and high-load workloads.

  • 04

    On-Die ECC with Extensive Validation for Data Integrity

    BIWIN DDR5 UDIMM supports on-die ECC for real-time detection and correction of single-bit errors, reducing the risk of system crashes. Each unit also undergoes rigorous quality testing to ensure reliable operation in performance-critical computing environments.